News and Press

April 02, 2008

Akrometrix Launches CTE Measurement Metrology Solution

Atlanta, Georgia USA – April 2, 2008 – Akrometrix (Atlanta, GA USA) announced its CTE characterization solution and test services for the global microelectronics industry.

Akrometrix has successfully integrated the Digital Image Correlation (DIC) technique for in-plane deformation characterization during thermal excursions with its industry leading TherMoiré Platform for temperature-dependent warpage measurement and analysis. Digital Image Correlation (DIC) enables engineers to calculate strain fields and relative changes during experimental simulation of reflow and curing manufacturing profiles and operating environments. A valuable metric that is produced is the temperature dependent coefficient of thermal expansion (CTE). Measurements can be performed on both homogeneous and composite structures.

Akrometrix partnered with Correlated Solutions, Inc. (Columbia, SC USA) in early 2007 to develop the modular metrology solution for integration with its TherMoiré Platform. Akrometrix began shipping the integrated metrology solution in March 2008. Akrometrix has offered Digital Image Correlation (DIC) test services on a contract basis since mid 2007.

“In-plane characterization at temperature is a critical offering for our customer base” said Akrometrix President & CEO, Patrick B. Hassell. “It is complementary to our out-of-plane (z-axis) characterization capabilities and more importantly, it produces valuable insight on how in-plane strains can directly impact solder joint integrity and reliability at interconnect regions (level I and II) and embedded components.”

About Akrometrix

Akrometrix is the leading provider of full-field metrology solutions for substrates and packages in the OEM/CEM/SATS/PCB segments of the microelectronics industry. Akrometrix’s TherMoiré and LineMoiré product lines offer comprehensive flatness characterization capabilities for development and production applications. A pioneer in the temperature dependent measurement arena, Akrometrix’s equipment is utilized by 95% of the top 20 global semiconductor manufacturers. Founded in 1994, Akrometrix is based in Atlanta, GA USA with operations and partners located in all major and developing microelectronics manufacturing regions of the world.